Product application space identification
Fundamental generation of nano colloid synthetic approaches, stabilization and functionalization
Classical and Quantum Mechanical crystalline structure and defect properties
Materials analysis including: SEM ( JEOL 6400 50 nm diameter resolution) elemental analysis capabilities in point, linescan, and mapping modes)
TEM (JEOL 2010 capable of 0.23 nm point resolution at 200 kV)
Software for interpreting diffraction patterns and searching for possible candidates. Quantitative elemental analysis capability in nano areas